Description
Application
Basic I-V/C-V measurement, PIV testing, design validation, IC engineering, wafer level reliability, MEMS, high power and failure analysis.
Features
Cost-effective – Extremely cost-effective model with basic probing functions.
Description
A very simple platform for basic I-V/C-V probing with micropositioners.
probing accessories, the system can be set up to work with multi meters, power supplies, SMUs measurement.
