Description
Designed to help you maximize efficiency, Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system.
Ultra-fast analysis is ensured thanks to one-click mode selection, sophisticated software and HD confocal scanning without moving parts.
Highly accurate surface analysis is essential in industry and research to help ensure optimal performance of materials and components. But there are challenges: surfaces can be made up of intricate structures with highly sloping areas demanding lateral resolution of a few microns, or critical micro peaks and valleys requiring vertical analysis on the sub-nanometer scale.
Versatile and accurate
- Optimal lateral resolution, slope solving and imaging with High Definition (HD) confocal microscopy
- Optimal vertical resolution up to 0.1 nm with HD interferometry
- Simple image capture with brightfield and darkfield microscopy
- Four LEDs for RGB HD true-color imaging and wider application range
- Three methods for measuring thick and thin films
- The right configuration and objective for your sample.
3D Surface Metrology
- No need to prepare samples or swap instruments
- Fast, reliable digital HD confocal scanning
- Capture large surfaces quickly with large FOV and topography stitching
- Intuitive 2D and 3D software for data acquisition and analysis.
Application
https://www.leica-microsystems.com/products/confocal-microscopes/p/leica-dcm8/app/
