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51 CHANGI BUSINESS PARK CENTRAL 2
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Leica Microscope
Stage Calibration Standards Micrometer
Confocal Interferometry Microscope Leica DCM8
Digital Microscope Leica DVM6
Digital Microscope Leica DMS1000
Digital Microscope Leica DMS1000 B
Inverted Microscope Leica DMi8
Inverted Microscope Leica DM ILM
Stereo Microscope Leica EZ4 W EZ4 E
Stereo Microscope Fluorescent Leica M165 FC
Stereo Microscope Leica LED3000 RL
Stereo Microscope Leica LED5000 RL
Upright Microscope Leica DM750
Upright Microscope Leica DM 2700 M
Upright Microscope Leica DM6
Upright Microscope Leica DM4 M
Leica Electron Microscopy
Ion Beam Milling System Leica EM TIC 3X
Leica EM VCT500
Leica EM TXP
Leica EM RAPID Pharmaceutical Milling System
Leica EM TRIM2
Sputter Coater and E Beam Coater
Low Vacuum Coater Leica EM ACE 200
Sputter Carbon E Beam Coater Leica EM ACE 600
Sputter Carbon E Beam Coater Leica EM ACE 600
Low Vacuum Coater Leica EM ACE 200
Sputter Targets
Platinum Palladium 80/20 Target
Palladium Target
Gold Palladium 60/40 Target
Tantalum Target
Molybdenum Target
Cobalt Target
Iron Fe Target
Tungsten Target
Ti Target
Chromium Target
Copper Target
Nickel Target
Iridium Target
Tungsten Wire
Precious Metal Wires
Metallographic Lapping Polishing
Diamond Cutting Wheel
Diamond Lapping Film
Metallographic System
Mounting Accessories
Polishing Cloth
Precision Cutting System
Silicon Carbide Paper Disc
Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
General Lab Consumables
Plastic and Glass Microscope Slides
Slide Warmers
Plastic Acid Resistant Tweezer
Wafer Tweezer
ESD Tweezer
Beaker Bottles Cylinder Tubes
Stirring Magnetic Bars Rods
Centrifuges Tubes Racks
Organizer
Plastic Transfer Pipettes
Scriber Cleaving Plier
AFM and STM Supplies
SPM AFM SEM Calibration Standards
AFM Large Radius Hemispherical Cantilever Probes
AFM Hemisperical Cone Shaped Cantilever Probes
AFM Improved Super Cone Cantilever Probes
AFM Super Sharp Improved Super Cone Cantilever Probes
AFM High Resolution Solid Carbon Cone Probes
Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
Electron Microscopy
Calibration Standards
Conductive Adhesives Tapes
Focus Ion Beam Consumables
Organic Starter Kit
Specimen Mounts for EBSD
Specimen Mounts for SEM
Transmission Electron Microscopy Grids
Cryo Supplies
Cleanroom & Safety Product
Histology Microbiology
Electrical Testing Consumables
Probe Station
Micropositioner
Probe Tips
Innovation Center Services
BGA Rework and Reballing
Coordinate Measuring Machine CMM
Scanning Electron Microscope SEM
3D Reconstruction
Metallographic Specimen Preparation
Mechanical Cross Sectioning
Energy dispersive X-ray spectroscopy EDS
Focused Ion Beam
Scanning Acoustic Microscopy
Broad Ion Beam
2D X-ray Imaging
Chemical Decapsulation
Electrical Validation
IV Curve Trace
Wire Pull Test
About Us
Quality Policy
Contact Us
Menu
Products search
Products
Leica Microscope
Stage Calibration Standards Micrometer
Confocal Interferometry Microscope Leica DCM8
Digital Microscope Leica DVM6
Digital Microscope Leica DMS1000
Digital Microscope Leica DMS1000 B
Inverted Microscope Leica DMi8
Inverted Microscope Leica DM ILM
Stereo Microscope Leica EZ4 W EZ4 E
Stereo Microscope Fluorescent Leica M165 FC
Stereo Microscope Leica LED3000 RL
Stereo Microscope Leica LED5000 RL
Upright Microscope Leica DM750
Upright Microscope Leica DM 2700 M
Upright Microscope Leica DM6
Upright Microscope Leica DM4 M
Leica Electron Microscopy
Ion Beam Milling System Leica EM TIC 3X
Leica EM VCT500
Leica EM TXP
Leica EM RAPID Pharmaceutical Milling System
Leica EM TRIM2
Sputter Coater and E Beam Coater
Low Vacuum Coater Leica EM ACE 200
Sputter Carbon E Beam Coater Leica EM ACE 600
Sputter Carbon E Beam Coater Leica EM ACE 600
Low Vacuum Coater Leica EM ACE 200
Sputter Targets
Platinum Palladium 80/20 Target
Palladium Target
Gold Palladium 60/40 Target
Tantalum Target
Molybdenum Target
Cobalt Target
Iron Fe Target
Tungsten Target
Ti Target
Chromium Target
Copper Target
Nickel Target
Iridium Target
Tungsten Wire
Precious Metal Wires
Metallographic Lapping Polishing
Diamond Cutting Wheel
Diamond Lapping Film
Metallographic System
Mounting Accessories
Polishing Cloth
Precision Cutting System
Silicon Carbide Paper Disc
Silicon Carbide Adhesive Backing Papers Ø 200 mm 8 Inch
Silicon Carbide Non-Adhesive Backing Papers Ø 200 mm 8 Inch
General Lab Consumables
Plastic and Glass Microscope Slides
Slide Warmers
Plastic Acid Resistant Tweezer
Wafer Tweezer
ESD Tweezer
Beaker Bottles Cylinder Tubes
Stirring Magnetic Bars Rods
Centrifuges Tubes Racks
Organizer
Plastic Transfer Pipettes
Scriber Cleaving Plier
AFM and STM Supplies
SPM AFM SEM Calibration Standards
AFM Large Radius Hemispherical Cantilever Probes
AFM Hemisperical Cone Shaped Cantilever Probes
AFM Improved Super Cone Cantilever Probes
AFM Super Sharp Improved Super Cone Cantilever Probes
AFM High Resolution Solid Carbon Cone Probes
Silver Coated 2″ 4″ Silicon Wafer, P-Type 100
Gold Coated 2″ 4″ Silicon Wafer, P-Type 100
Electron Microscopy
Calibration Standards
Conductive Adhesives Tapes
Focus Ion Beam Consumables
Organic Starter Kit
Specimen Mounts for EBSD
Specimen Mounts for SEM
Transmission Electron Microscopy Grids
Cryo Supplies
Cleanroom & Safety Product
Histology Microbiology
Electrical Testing Consumables
Probe Station
Micropositioner
Probe Tips
Innovation Center Services
BGA Rework and Reballing
Coordinate Measuring Machine CMM
Scanning Electron Microscope SEM
3D Reconstruction
Metallographic Specimen Preparation
Mechanical Cross Sectioning
Energy dispersive X-ray spectroscopy EDS
Focused Ion Beam
Scanning Acoustic Microscopy
Broad Ion Beam
2D X-ray Imaging
Chemical Decapsulation
Electrical Validation
IV Curve Trace
Wire Pull Test
About Us
Quality Policy
Contact Us
ISO 9001:2015
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Metallographic System
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FORCIPOL 102
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Description
Polishing system
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