AFM and STM Supplies

Precision Tools for Nanoscale Imaging

Enhance your atomic force and scanning tunneling microscopy capabilities with our comprehensive range of high-quality supplies:

• Advanced AFM Probes:
  • Hemispherical cone shaped cantilevers
  • High-resolution solid carbon cone probes
  • Improved super cone cantilevers
  • Large radius hemispherical cantilevers
  • Super sharp improved super cone cantilevers
  • High-resolution magnetic force microscopy probes
• Specialized Substrates:
  • Gold and silver coated silicon wafers (2″ and 4″, P-type 100)
  • Gold and silver coated microscope slides
  • Gold coated square coverslips

Our precision-engineered probes and meticulously prepared substrates ensure unparalleled imaging resolution and consistency for your nanoscale research. Suitable for a wide range of applications in materials science, semiconductor research, and nanotechnology.