Description
AFM High Resolution Solid Carbon Cone Probes
High resolution solid carbon cone shaped tip manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures.
| Tip Apex Specifications | |
| Radius: | ~ 3 nm |
| Full cone angle: | > 300 nm |
| Tip height: | > 9 µm |
| Available Cantilevers: | |
| C = 40 N/m, fo = 300 kHz | |
| C = 3.0 N/m, fo = 75 kHz | |
| C = 0.7 N/m, fo = 45 kHz | |
| C = 0.2 N/m, fo = 15 kHz | |
Available in Pack of 5 pcs
