Description
AFM Improved Super Cone Cantilever Probes
Multipurpose tip for simultaneous measurement of roughness and large step height.
Application
Surface Roughness
Topography Imaging
Step Height Measurements
| Tip Apex Specifications | |
| Radius: | < 10 nm |
| Full cone angle: | < 10° for > 3 µm |
| Tip height: | > 9 µm |
| Available Cantilevers: | |
| C = 40 N/m, fo = 300 kHz | |
| C = 3.0 N/m, fo = 75 kHz | |
| C = 0.7 N/m, fo = 45 kHz | |
| C = 0.2 N/m, fo = 15 kHz | |
Available in Pack of 5 pcs
